(RP) SMART Modular Announces SMART Zefr Memory with Ultra-High Reliability Performance for Demanding Compute Applications

Technologies modulaires intelligentes, Inc. ("SMART"), une division de SGH et un leader mondial des solutions de mémoire, disques SSD, and hybrid storage products announces its SMART Zefr Memory, a proprietary process that eliminates more than 90% of memory reliability failures and optimizes memory subsystems for maximum uptime. System start-up delays are frequently attributed to memory errors. These failures reduce system efficiency and may also lead to higher maintenance costs and lower system yield rates. These failures reduce system efficiency and may also lead to higher maintenance costs and lower system yield rates. SMART Zefr Memory has been tested under real-world conditions to identify and filter out marginal components that may undermine memory reliability.

SMART Zefr Memory uses a proprietary screening process developed by SMART that when performed on memory modules ensures the industry’s highest levels of uptime and reliability. SMART Zefr Memory is ideally suited for data centers, hyperscalers, calcul haute performance (CHP) platforms, and other environments that run large memory applications and depend on uptime for customers.